• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    Provided in the present disclosure is an array substrate, comprising: a base substrate; and multiple pixel units arranged in an array on said base substrate, each pixel unit comprising: a broken circuit repair structure, an OLED and a pixel driver circuit, the broken circuit repair structure being provided with a repair line; an orthographic projection of the repair line onto the base substrate partly or fully coincides with an orthographic projection of an anode of the OLED onto the base substrate, forming a coincident region; a broken circuit repair point is located in the coincident region.
    公开号:EP3680935A1
    申请号:EP18849825.7
    申请日:2018-09-04
    公开日:2020-07-15
    发明作者:Hongfei Cheng
    申请人:BOE Technology Group Co Ltd；
    IPC主号:H01L27-00
    专利说明:
    [0001] This application claims priority to and benefits of Chinese Patent Application No. 201721127658.4 , filed with the Chinese Patent Office on September 4, 2017, titled "ARRAY SUBSTRATE AND DISPLAY DEVICE", which is incorporated herein by reference in its entirety. TECHNICAL FIELD
    [0002] The present disclosure relates to the field of display technologies, and in particular, to an array substrate and a display device. BACKGROUND
    [0003] Organic light-emitting diodes (abbreviated as OLEDs), especially active-matrix organic light-emitting diodes (abbreviated as AMOLEDs), have been widely used in the display field due to advantages of high brightness, full viewing angle, fast response, and flexible display. SUMMARY
    [0004] In a first aspect, some embodiments of the present disclosure provide an array substrate, including a base substrate, and a plurality of pixel units arranged in an array on the base substrate. Each pixel unit includes an open-circuit repair structure, an OLED, and a pixel driving circuit, and the open-circuit repair structure inlcudes a repair line. An orthographic projection of the repair line on the base substrate partially or completely overlaps with an orthographic projection of an anode of the OLED on the base substrate to form an overlapping region. An open-circuit repair point is disposed in the overlapping region.
    [0005] In some embodiments of the present disclosure, the pixel driving circuit includes at least one thin film transistor. The at least one thin film transistor is a driving thin film transistor, or the at least one thin film transistor is a driving thin film transistor and a switching thin film transistor.
    [0006] In some embodiments of the present disclosure, a repair line in any one of two adjacent pixel units is coupled to a drain of a driving thin film transistor in another pixel unit of the two adjacent pixel units.
    [0007] In some embodiments of the present disclosure, an insulating film layer is disposed between the repair line and the anode of the OLED.
    [0008] In some embodiments of the present disclosure, in a case where the two adjacent pixel units are pixel units in adjacent rows and a same column, the repair line in any one of the two adjacent pixel units is an extension line of the drain of the driving thin film transistor in another pixel unit of the two adjacent pixel units.
    [0009] In some embodiments of the present disclosure, an orthographic projection of the extension line of the drain of the driving thin film transistor in each pixel unit on the base substrate partially or completely overlaps with an orthographic projection of an extension line of the anode of the OLED in the pixel unit on the base substrate to form an overlapping region.
    [0010] In some embodiments of the present disclosure, a passivation layer and a planarization layer are stacked on a surface of an extension line of a drain of a driving thin film transistor in each pixel unit proximate to an extension line of the anode of an OLED in the pixel unit. A region of the planarization layer corresponding to the open-circuit repair point is provided with a groove, and the groove is covered with the extension line of the anode.
    [0011] In some embodiments of the present disclosure, via holes are formed in the passivation layer and the planarization layer, and the drain of the driving thin film transistor is coupled to the anode of the OLED through one of the via holes.
    [0012] In some embodiments of the present disclosure, in a case where the two adjacent pixel units are pixel units in adjacent cloumns and a same row, the repair line in any one of the two adjacent pixel units is insulated from a gate of the driving thin film transistor in another pixel unit of the two adjacent pixel units in a same layer, and an interlayer insulating layer is disposed between the repair line and the drain of the driving thin film transistor.
    [0013] In some embodiments of the present disclosure, the interlayer insulating layer is provided with via holes, and the drain of the driving thin film transistor is coupled to the repair line through one of the via holes.
    [0014] In some embodiments of the present disclosure, an interlayer insulating layer, a passivation layer and a planarization layer are stacked between the repair line in each pixel unit and the anode of the OLED in the pixel unit. A region of the planarization layer corresponding to the open-circuit repair point is provided with a groove, and the groove is covered with the anode of the OLED in the pixel unit. Regions of the planarization layer and the passivation layer corresponding to the open-circuit repair point are provided with grooves, and the grooves are covered with the anode of the OLED in the pixel unit.
    [0015] In some embodiments of the present disclosure, a gate of the switching thin film transistor is coupled to a gate line, and a source of the switching thin film transistor is coupled to a data line.
    [0016] In some embodiments of the present disclosure, pixel units in a same row correspond to a same gate line. An orthographic projection of the repair line in each pixel unit on the base substrate intersects with an orthographic projection of a corresponding gate line on the base substrate.
    [0017] In another aspect, some embodiments of the present disclosure provide a display device, including the array substrate as described in the first aspect. The array substrate includes a base substrate and a plurality of pixel units arranged in an array on the base substrate. Each pixel unit includes an open-circuit repair structure, an OLED, and a pixel driving circuit, and the open-circuit repair structure includes a repair line. An orthographic projection of the repair line on the base substrate partially or completely overlaps with an orthographic projection of the anode of the OLED on the base substrate to form an overlapping region. An open-circuit repair point is disposed in the overlapping region. BRIEF DESCRIPTION OF THE DRAWINGS
    [0018] In order to describe technical solutions in embodiments of the present disclosure more clearly, the accompanying drawings to be used in the description of embodiments will be introduced briefly. Obviously, the drawings to be described below are merely some embodiments of the present disclosure, and an ordinary person skilled in the art can obtain other drawings according to these drawings without paying any creative effort.FIG. 1 is a circuit schematic diagram of a pixel driving circuit in the related art; FIG. 2 is a schematic top view of an array substrate, in accordance with some embodiments of the present disclosure; FIG. 3 is a schematic cross-sectional view of the array substrate shown in FIG. 2 along a fold line A-A'; FIG. 4 is another schematic top view of an array substrate, in accordance with some embodiments of the present disclosure; and FIG. 5 is a schematic cross-sectional view of the array substrate shown in FIG. 4 along a fold line B-B'. DETAILED DESCRIPTION
    [0019] In order to make the objects, technical solutions and advantages of the embodiments of the present disclosure clearer, the technical solutions in embodiments of the present disclosure will be described clearly and completely with reference to the drawings in embodiments of the present disclosure. Obviously, the described embodiments are some but not all of embodiments of the present disclosure. All other embodiments obtained on the basis of the embodiments of the present disclosure by an ordinary person skilled in the art without paying any creative effort shall be included in the protection scope of the present disclosure.
    [0020] As described above, in the display field, the array substrate including active-matrix organic light-emitting diodes (AMOLEDs) has a plurality of pixel units arranged in an array. Pixel units in a same row share a gate line, and pixel units in a same column share a data line. Each pixel unit includes an organic light-emitting diode (OLED) and a pixel driving circuit coupled to an anode of the OLED.
    [0021] The circuit schematic diagram of the pixel driving circuit is shown in FIG. 1. The pixel driving circuit includes a switching thin film transistor T1, a driving thin film transistor T2, and a storage capacitor. A gate of the switching thin film transistor T1 is coupled to a gate line Gate, a source of the switching thin film transistor T1 is coupled to a data line Data, and a drain of the switching thin film transistor T1 is coupled to a gate of the driving thin film transistor T2 and a plate C1 of the storage capacitor. A source of the driving thin film transistor T2 is coupled to another plate C2 of the storage capacitor and a power line Vdd, and a drain of the driving thin film transistor T2 is coupled to the anode of the OLED.
    [0022] However, since the structures of the pixel driving circuits in the pixel units are relatively complicated, the manufacturing process of the array substrate in which the pixel units are located is also complicated. As a result, in the manufacturing process of the array substrate, it is inevitable to result in a defect that a part of wirings in the pixel driving circuits are open circuit, and the position where the open circuit occurs is a open-circuit point X'. In this case, for a pixel driving circuit having a complicated structure, it is difficult to accurately determine the position of the open-circuit point X' by using an existing fault detection technology, and thus it is impossible to effectively repair the array substrate having the defect that the pixel driving circuit is open circuit.
    [0023] Based on the above problem, the technical solutions in embodiments of the present disclosure will be described in detail in conjunction with the drawings.
    [0024] FIGS. 2 and 3 illustrate an array substrate provided by some embodiments of the present disclosure. Referring to FIGS. 2 and 3, the array substrate provided by some embodiments of the present disclosure includes a base substrate 1 and a plurality of pixel units arranged in an array on the base substrate 1. As shown in FIG. 2, four pixel units are provided. Each pixel unit includes an open-circuit repair structure 2, an OLED 3, and a pixel driving circuit 4. The open-circuit repair structure 2 includes a repair line 22, and an orthographic projection of the repair line 22 on the base substrate 1 partially or completely overlaps with an orthographic projection of an anode 301 of the OLED on the base substrate 1 to form an overlapping region. The open-circuit repair point X is located in the overlapping region.
    [0025] The above array substrate is prone to a defect, i.e., the open-circuit repair point X, in the manufacturing process due to its complicated pixel driving structure. The repair line 22 has an overlapping portion with the anode 301 of the OLED, and the overlapping portion is embodied on an orthographic projection of the two on the substrate, so that the open-circuit repair point X is located in the overlapping region, enabling the anode 301 of the OLED of any one of two adjacent pixel units to be coupled to a drain 4011 of the driving thin film transistor 401 of another pixel unit of the two adjacent pixel units, thereby repairing the open-circuit repair point without affecting other components.
    [0026] In some embodiments of the present disclosure, in a pixel unit, in a case where an open circuit, i.e., an open-circuit point X', occurs between the drain 4011 of the driving thin film transistor 401 and the anode 301 of the OLED, the driving thin film transistor 401 cannot be coupled to the anode 301 of the OLED, so the pixel unit cannot emit light. In this case, the pixel unit is referred to as a pixel unit to be repaired, and a pixel unit around it is referred to as an adjacent pixel unit. Since the drain 4011 of the driving thin film transistor 401 in the adjacent pixel unit adjacent to the pixel unit to be repaired is coupled to the repair line 22, and the repair line 22 is coupled to the anode 301 of the OLED in the pixel unit to be repaired, the open-circuit repair point X is repaired, so that the wiring in the pixel unit to be repaired is restored to be coupled, thereby causing the pixel unit to be restored to emit light.
    [0027] Currently, all flat panel displays are driven in a matrix driving mode. The plurality of pixel units are arranged in an array on the base substrate 1 of the array substrate. For convenience of description, in a case where the pixel driving circuit 4 of one of the plurality of pixel units is open circuit, the pixel unit is defined as a pixel unit to be repaired, and a pixel unit around the pixel unit arranged on the base substrate 1 is defined as an adjacent pixel unit.
    [0028] It will be noted that the pixel unit to be repaired and the adjacent pixel unit belong to a same type of pixel units, and have a same structure and function. A division is only for the purpose of clearly explaining the specific structure of the array substrate, that is, defining a target pixel unit that may require an open-circuit repair as a pixel unit to be repaired, and another pixel unit adjacent to the pixel unit to be repaired is defined as an adjacent pixel unit. In some embodiments of the present disclosure, in a case where any one of two adjacent pixel units is referred to as the pixel unit to be repaired, another pixel unit of the two adjacent pixel units is referred to as the adjacent pixel unit.
    [0029] 22 It will be understood that the anode 301 of the OLED and the repair line 22 are located in a same pixel unit. Since the anode 301 of the OLED is provided in the pixel unit, the array substrate having the pixel unit shall be an OLED substrate, that is, each pixel unit of the array substrate is correspondingly provided with an OLED 3 and a pixel driving circuit 4 coupled to the anode 301 of the OLED.
    [0030] In some embodiments of the present disclosure, the OLED 3 may be any one of a top-emitting OLED, a bottom-emitting OLED, or a double-sided emitting OLED.
    [0031] It will be noted that only four pixel units arranged in an array are shown in FIG. 2, which are used for emitting light of same or different colors. However, it will be understood by those skilled in the art that the number of pixel units included in the array substrate in the embodiments of the present disclosure is not limited to the four shown, and may include more, and colors of the light emitted by the pixel units are not limited.
    [0032] In some embodiments of the present disclosure, the pixel driving circuit 4 includes at least one thin film transistor. The at least one thin film transistor is a driving thin film transistor 401 and a switching thin film transistor 402.
    [0033] In some embodiments of the present disclosure, the pixel driving circuit 4 for the OLED 3 may include at least one thin film transistor. In a case where the pixel driving circuit 4 includes one thin film transistor, the thin film transistor is a driving thin film transistor 401. In a case where the pixel driving circuit 4 includes a plurality of thin film transistors, the driving thin film transistor 401 refers to a thin film transistor in which the drain 4011 is coupled to the anode 301 of the OLED. The drain 4011 of the driving thin film transistor 401 and the anode 301 of the OLED may be electrically connected.
    [0034] In some embodiments of the present disclosure, as shown in FIGS. 2 and 3, the provided repair line 22 is coupled to the drain 4011 of the driving thin film transistor 401 in the adjacent pixel unit. An insulating film layer is disposed between the repair line 22 and the anode 301 of the OLED. An orthographic projection of the repair line 22 on the base substrate 1 has an overlapping region with an orthographic projection of the anode 301 of the OLED in the pixel unit to be repaired on the base substrate 1. In the case where the drain 4011 of the driving thin film transistor 401 is coupled to the repair line 22, the insulating film layer disposed between the repair line 22 and the anode 301 of the OLED may prevent the repair line 22 from contacting the anode 301 of the OLED, thereby preventing a short circuit between the drain 4011 and the anode 301.
    [0035] In other words, a film layer for insulation is provided between the anode 301 of the OLED in the pixel unit to be repaired and the repair line 22, and a portion of the anode 301 of the OLED in the pixel unit to be repaired corresponding to the overlapping region is disposed opposite to a portion of the repair line 22 corresponding to the overlapping region. In this way, in a case where a pixel unit to be repaired having an open-circuit defect in the pixel driving circuit is repaired, the open-circuit repair point X will be correspondingly disposed in the overlapping region.
    [0036] At the open-circuit repair point X, the anode 301 of the OLED of the pixel unit to be repaired is coupled to the repair line 22 by deep penetration laser welding, so that the anode 301 of the OLED of the pixel unit to be repaired and the drain 4011 of the driving thin film transistor 401 in the adjacent pixel unit may be coupled by using the anode 301 of the OLED in the pixel unit to be repaired and the repair line 22.
    [0037] In some embodiments of the present disclosure, referring to FIGS. 2 and 3, the pixel driving circuit 4 of the OLED 3 includes two thin film transistors, which are a switching thin film transistor 402 and a driving thin film transistor 401. A gate 4021 of the switching thin film transistor 402 is coupled to a gate line 6, and a source 4022 of the switching thin film transistor 402 is coupled to a data line 7, and a drain 4023 of the switching thin film transistor 402 is coupled to the gate 4013 of the driving thin film transistor 401 and the first plate C1 of the storage capacitor. A source 4012 of the driving thin film transistor 401 is coupled to the second plate C2 of the storage capacitor and the power line Vdd, and the drain 4011 of the driving thin film transistor 401 is coupled to the anode 301 of the OLED.
    [0038] In some embodiments of the present disclosure, the gate line 6 and the data line 7 may be made of one or more of the metal materials, such as copper (Cu), aluminum (Al), molybdenum (Mo), titanium (Ti), chromium (Cr), and tungsten (W), or their alloy materials. For example, a single-layer metal wire is made of copper, and a laminated metal wire is made of MoAlMo, a laminated metal wire is made of TiCuTi, or a laminated metal wire is made of MoTiCu, etc.
    [0039] Based on the array substrate provided by the above embodiments, in a case where a driving circuit is open citcuit in a pixel unit, that is, in a case where there is a pixel unit to be repaired, the open-circuit repair structure 2 in the pixel unit to be repaired may be utilized to effectively repair the pixel unit to be repaired, and the anode 301 of the OLED in the pixel unit to be repaired may be coupled to the drain 4011 of the driving thin film transistor 401 in the adjacent pixel unit, so that the OLED 3 in the pixel unit to be repaired may be driven by the driving thin film transistor 401 in the adjacent pixel unit to ensure the normal use of the array substrate.
    [0040] In some embodiments of the present disclosure, referring to FIG. 2, the pixel units in the array substrate are generally arranged in an array on the base substrate 1. Pixel units in a same row are provided with a control signal by a same gate line 6, and pixel units in a same column are provided with a data signal by a same data line 7.
    [0041] Therefore, the gate line 6 and the gates of the thin film transistors in the pixel units are generally disposed in a same layer, and the data line 7 and the sources and the drains of the thin film transistors in the pixel units are generally disposed in a same layer. The gate lines and the data lines are disposed crosswise to form a grid structure, so that a single pixel unit is correspondingly disposed in a single grid. Each pixel unit may be a pixel unit to be repaired, or an adjacent pixel unit around a pixel unit to be repaired.
    [0042] In some embodiments of the present disclosure, referring to FIGS. 2 and 3, each pixel unit generally includes a driving thin film transistor 401 disposed on the base substrate 1, and an OLED 3 disposed at a side of the driving thin film transistor 401 away from the base substrate 1.
    [0043] The OLED 3 generally includes an OLED anode 301 and an OLED cathode 303 disposed opposite to each other, and an OLED light-emitting layer 302 disposed between the OLED anode 301 and the OLED cathode 303. In a case where the OLED 3 is a bottom-emitting OLED, the OLED cathode 303 is generally made of a metal material such as aluminum (Al), and the OLED anode 301 is generally made of the indium tin oxide (ITO) material. In addition, the OLED light-emitting layer 303 may be a single-layer organic light-emitting layer, or a multilayer structure formed of a hole transport layer, an organic light-emitting layer, an electron transport layer, or the like.
    [0044] In some embodiments of the present disclosure, the driving thin film transistor 401 may be any one of an oxide semiconductor thin film transistor, a polysilicon thin film transistor, or an amorphous silicon thin film transistor according to the working principle of the thin film transistor. The driving thin film transistor 3 may be any one of a top-gate thin film transistor or a bottom-gate thin film transistor according to the position where the gate of the thin film transistor is disposed, which is not specifically limited in the embodiments of the present disclosure.
    [0045] For example, referring to FIG. 3, some embodiments of the present disclosure provide a top-gate thin film transistor structure. The top-gate thin film transistor includes an active layer 4014, a gate insulating layer 901, a gate 4013, and an interlayer insulating layer 902 stacked on the base substrate 1. A drain 4011 and a source 4012 are disposed on the interlayer insulating layer 902. The drain 4011 and the source 4012 are coupled to the active layer 4014 respectively through via holes correspondingly formed in the interlayer insulating layer 902 and the gate insulating layer 901. In some embodiments of the present disclosure, the active layer 4014 may be an indium gallium zinc oxide (IGZO) layer. The gate insulating layer 901 may be a single layer structure such as a silicon nitride layer or a silicon oxide layer, or a multilayer structure such as a stacked structure formed of a silicon nitride layer and a silicon oxide layer.
    [0046] In some embodiments of the present disclosure, referring to FIG. 3, a passivation layer 903, a planarization layer 904, and a pixel defining layer 905 are generally disposed on a surface of the drain 4011 of the driving thin film tansistor 401 facing the anode 301 of the OLED. The OLED 3 is disposed in an open region of the pixel defining layer 905. In some embodiments of the present disclosure, the passivation layer 903 may be a single layer structure, such as a silicon nitride layer or a silicon oxide layer, or may be a multilayer structure, such as a stacked structure formed of a silicon nitride layer and a silicon oxide layer. The planarization layer 904 is generally a resin layer having a thickness of 1 µm to 4 µm and made of an organic resin material.
    [0047] In some embodiments of the present disclosure, via holes are formed in the passivation layer 903 and the planarization layer 904. The anode 301 of the OLED is coupled to the drain 4011 of the driving thin film transistor 401 through the via hole formed in the planarization layer 904 and the passivation layer 903. In this way, the distance between the anode 301 of the OLED in the pixel unit to be repaired and the repair line 22 is shortened, so that the anode 301 of the OLED and the repair line 22 are welded quickly during the repair process. In this case, in the open-circuit repair structure 2 of the pixel unit to be repaired, there is also the passivation layer 903 and the planarization layer 904 disposed between the repair line 22 and the anode 301 of the OLED of the pixel unit to be repaired.
    [0048] In order to facilitate the fabrication of the open-circuit repair structure, in some embodiments of the present disclosure, referring to FIG. 2, the adjacent pixel unit of the pixel unit to be repaired is a pixel unit in an adjacent row and a same column of the pixel unit to be repaired, that is, any one of the pixel units in adjacent rows and the same column of the pixel unit to be repaired. In this case, the repair line 22 may be provided as an extension line of the drain 4011 of the driving thin film transistor 401 of the pixel unit in the adjacent row and the same column. In this way, the repair line 22 and the drain 4011 of the driving thin film transistor 401 are integrally formed, which may not only simplify the manufacturing process of the pixel repair structure 2 in the pixel unit to be repaired to facilitate the fabrication of the array substrate, but also ensure that the repair line 22 is reliably coupled to the drain 4011 of the driving thin film transistor 401 of the pixel unit in the adjacent row and the same column.
    [0049] It will be understood that, in some embodiments of the present disclosure, referring to FIG. 2, in a case where the repair line 22 is the extension line of the drain 4011 of the driving thin film transistor 401 of the pixel unit in the adjacent row and the same column, an orthographic projection of the extension line of the drain 4011 on the base substrate 1 partially or completely overlaps with an orthographic projection of an anode extension line 3011 of the anode 301 of the OLED in the pixel unit to be repaired on the base substrate to form an overlapping region.
    [0050] In some embodiments of the present disclosure, as shown in FIG. 3, the anode extension line 3011 of the anode 301 of the OLED refers to a portion of the anode 301 of the OLED corresponding to the extension line of the drain 4011, that is, the anode extension line 3011 is an integral part of the anode 301 of the OLED.
    [0051] In a limited space of the array substrate, by using the anode extension line 3011 of the anode 301 of the OLED in the pixel unit to be repaired, and an extension line of the drain 4011 of the driving thin film transistor 401 of the pixel unit in the adjacent row and the same column, the space occupation of the open-circuit repair structure 2 may be optimized while the open-circuit repair structure 2 in the pixel unit to be repaired is formed, which is beneficial to improving the space utilization of the array substrate.
    [0052] In order to improve repair reliability of the open-circuit repair structure, in some embodiments of the present disclosure, referring to FIG. 3, a groove 8 may be disposed in a region of the planarization layer 904 corresponding to the open-circuit repair point X. The groove depth of the groove 8 may be less than or equal to the thickness of the planarization layer 904. In this way, in a case where the anode extension line 3011 of the anode 301 of the OLED in the pixel unit to be repaired is formed by deposition, the anode extension line 3011 covers and fills the groove 8. Therefore, the distance between the extension line 3011 and the repair line 22 in a corresponding region where the open-circuit repair point X is located is effectively shortened, so as to ensure the reliable welding between the anode extension line 3011 and the repair line 22 when the anode extension line 3011 and the repair line 22 are welded by means of the deep penetration laser welding, thereby improving the conduction reliability of the anode extension line 3011 and the repair line 22 after being repaired and coupled, that is, improving the repair reliability of the open-circuit repair structure 5.
    [0053] In some embodiments of the present disclosure, with continuous reference to FIG. 2, the gate line 6 and the gates of the thin film transistors in the pixel units are generally disposed in the same layer, the data line 7 and the sources and the drains of the thin film transistors in the pixel units are generally disposed in the same layer, and the gate lines and the data lines are disposed crosswise. In a case where the pixel unit in the adjacent row and the same column is selected as the adjacent pixel unit, an orthogonal projection of the repair line 22 on the base substrate 1 intersects with an orthographic projection of a corresponding gate line 6 on the base substrate 1.
    [0054] Based on the above embodiments, FIGS. 4 and 5 of the present disclosure provide another arrangement of the pixel units to be repaired and the adjacent pixel units on the array substrate.
    [0055] In some embodiments of the present disclosure, as shown in FIG. 4, FIG. 4 is another schematic top view of an array substrate, in accordance with some embodiments of the present disclosure.
    [0056] The difference between the array substrate shown in FIGS. 4 and 5 and the array substrate shown in FIGS. 2 and 3 mainly lies in the arrangement of the repair line 22 in the open-circuit repair structure 2. However, other structures in the pixel unit, such as the OLED or the driving thin film transistor, are the same as or similar to those in the array substrate shown in FIGS. 2 and 3, which will not be described again. The relevant parts can refer to part of the description of the array substrate shown in FIGS. 2 and 3.
    [0057] Referring to FIGS. 4 and 5, in the array substrate provided by some embodiments of the present disclosure, every two adjacent pixel units are pixel units in the adjacent columns and the same row, that is, the adjacent pixel unit of the pixel unit to be repaired is a pixel unit in the adjacent column and the same row of the pixel unit to be repaired. The repair line 22 in the open-circuit repair structure 2 of the pixel unit to be repaired is coupled to the drain 4011 of the driving thin film transistor 401 of the pixel unit in the adjacent column and the same row. In this way, after the anode 301 of the OLED of the pixel unit to be repaired and the repair line 22 are coupled at the open-circuit repair point X by means of the deep penetration laser welding, the anode 301 of the OLED of the pixel unit to be repaired and the repair line 22 may be utilized to achieve that the anode 301 of the OLED in the pixel unit to be repaired and the drain 4011 of the driving thin film transistor of the pixel unit in the adjacent column and the same row are coupled, thereby driving the OLED 3 in the pixel unit to be reparied by utilizing the driving thin film transistor 401 of the pixel unit in the adjacent column and the same row.
    [0058] It will be understood that, as shown in FIGS. 4 and 5, in this arrangement, in a case where an open circuit, that is, the open-circuit point X', occurs between the drain 4011 of the driving thin film transistor 401 of any one of the pixel units and the anode 301 of the OLED in the pixel unit, the pixel unit is the pixel unit to be repaired, and the pixel unit around it is the adjacent pixel unit. Similar to the previous arrangement of the pixel unit, since the drain 4011 of the driving thin film transistor 401 of the adjacent pixel unit is coupled to the repair line 22 in the pixel unit to be repaired, the drain 4011 of the driving thin film transistor 401 of the adjacent pixel unit is coupled to the anode 301 of the OLED in the pixel unit to be repaired through the repair line 22, thereby repairing the open circuit, and the pixel unit to be repaired re-emit light.
    [0059] In some embodiments of the present disclosure, referring to FIG. 4, the pixel units in the array substrate are generally arranged in an array on the base substrate. Pixel units in a same row are provided with a control signal by a same gate line 6, and pixel units in a same column are provided with a data signal by a same data line 7. In some embodiments of the present disclosure, the gate line 6 is generally disposed in the same layer as the gates of the thin film transistors in the pixel units, and the data line 7 is generally disposed in the same layer as the sources and the drains of the thin film transistors of the pixel units. Gate lines and data lines are disposed crosswise to form a grid structure, so that a single pixel unit is correspondingly disposed in a single grid. Each pixel unit may be a pixel unit to be repaired, or an adjacent pixel unit around a pixel unit to be repaired.
    [0060] As shown in FIG. 4, only four pixel units arranged in an array are shown in FIG. 4, which are used for emitting light of the same or different colors. However, it will be understood by those skilled in the art that the number of pixel units provided by the array substrate provided by the embodiments of the present disclosure is not limited to the four shown, and may include more, and colors of the light emitted by the pixel units are not limited.
    [0061] In some embodiments of the present disclosure, the data line 7 and the sources and the drains of the thin film transistors in the pixel units are generally disposed in the same layer. In a case where the repair line 22 is coupled to the drain 4011 of the driving thin film transistor 401 of the pixel unit in the adjacent column and the same row, the repair line 22 needs to correspondingly pass through a region where the data line 7 is disposed. Therefore, in order to prevent the repair line 22 from being coupled to the data line 7, in some embodiments of the present disclosure, the repair line 22 and the gate 4013 of the driving thin film transistor 401 of the pixel unit in the adjacent column and the same row are disposed in the same layer and insulated from each other.
    [0062] For example, referring to FIGS. 4 and 5, in some embodiments of the present disclosure, the gate 4013 of the driving thin film transistor 401 of each pixel unit is disposed at a side of the drain 4011 away from the anode 301 of the OLED, and an interlayer insulating layer 902 is provided between the gate 4013 and the drain 4011. The repair line 22 and the gate 4013 of the driving thin film transistor 401 are disposed in the same layer and insulated from each other. In this way, the repair line 22 and the gate 4013 of the driving thin film transistor 401 may be formed in a single patterning process, which is advantageous for simplifying the manufacturing process of the open-circuit repair structure in the pixel unit to improve the production efficiency of the array substrate.
    [0063] In some embodiments of the present disclosure, via holes are formed in the interlayer insulating layer 902. In this case, the drain 4011 of the driving thin film transistor 401 of the pixel unit in the adjacent column and the same row is coupled to the repair line 22 through the via hole provided in the interlayer insulating layer 902. In a case where the data line 7 and the drain 4011 of the driving thin film transistor 401 are disposed in the same layer, an orthographic projection of the repair line 22 on the base substrate intersects with an orthographic projection of a corresponding data line 7 on the base substrate.
    [0064] In some embodiments of the present disclosure, referring to FIG. 5, the passivation layer 903 and the planarization layer 904 are generally stacked on a surface of the drain 4011 of the driving thin film transistor 401 proximate to the anode 301 of the OLED. The anode 301 of the OLED is coupled to the drain 4011 of the driving thin film transistor 401 through the via hole provided in the planarization layer 904 and the passivation layer 903. In this case, in the open-circuit repair structure 2 of the pixel unit to be repaired, since the repair line 22 and the gate 4013 of the driving thin film transistor 401 of the pixel unit in the adjacent colomn and the same row are disposed in the same layer and insulated from each other, the interlayer insulating layer 902, the passivation layer 903, and the planarization layer 904 are sequentially disposed between the repair line 22 and the anode 301 of the OLED in the pixel unit to be repaired.
    [0065] In order to improve the repair reliability of the open-circuit repair structure, in some embodiments of the present disclosure, a groove 8 is formed in a region of the planarization layer 904 corresponding to the open-circuit repair point X, and a groove 8 may also be formed in regions of the planarization layer 904 and the passivation layer 903 corresponding to the open-circuit repair point X. In this case, the groove depth of the groove 8 is less than or equal to the total thickness of the planarization layer 904 and the passivation layer 903.
    [0066] In a case where the anode 301 of the OLED in the pixel unit to be repaired is formed by deposition, the anode 301 of the OLED covers and fills the groove 8, and in this way, the distance between the anode 301 of the OLED in the pixel unit to be repaired and the repair line 22 in a corresponding region of the open-circuit repair point X is effectively shortened, so as to ensure the reliable welding between the anode 301 of the OLED in the pixel unit to be repaired and the repair line 22 when the anode 301 and the repair line 22 are welded by means of the deep penetration laser welding, thereby improving the conduction reliability of the anode 301 of the OLED in the pixel unit to be repaired and the repair line 22 after being repaired and coupled, that is, improving the repair reliability of the open-circuit repair structure 2.
    [0067] With continuous reference to FIGS. 3 and 5, in the array substrate provided in some embodiments of the present disclosure, the pixel defining layer 905 is generally disposed on a surface of the planarization layer 904 away from the base substrate 1. The pixel defining layer 905 is generally a resin layer having a thickness of 1 µm to 3 µm and made of an organic resin material. The OLED 3 is generally disposed in an open region of the pixel defining layer 905. In this case, in the open-circuit repair structure of the pixel unit to be repaired, a portion of the anode 301 of the OLED corresponding to the open-circuit repair point X is covered with the pixel defining layer 905, so that the open-circuit repair structure of a normal array substrate is insulated and protected by utilizing the pixel defining layer 905.
    [0068] Some embodiments of the present disclosure further provide a display device. The display device includes the above array substrate. The array substrate includes a base substrate and a plurality of pixel units arranged in an array on the base substrate. Each pixel unit includes an open-circuit repair structure, an OLED, and a pixel driving circuit, and the open-circuit repair structure includes a repair line. An orthographic projection of the repair line on the base substrate partially or completely overlaps with an orthographic projection of the anode of the OLED on the base substrate to form an overlapping region. An open-circuit repair point is disposed in the overlapping region. The array substrate in the display device has same advantages as the array substrate in the above embodiments, which will not be described herein again.
    [0069] For example, the display device provided by some embodiments of the present disclosure may be a product or component having a display function, such as a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital photo frame, or a navigator.
    [0070] In the above description of the embodiments, specific features, structures, materials or characteristics may be combined in any appropriate manner in any one or more embodiments or examples.
    [0071] The foregoing descriptions are merely some specific implementation manners of the present disclosure, but the protection scope of the present disclosure is not limited thereto, and the changes or replacements that any person skilled in the art can easily think of in the technical scope disclosed by the present disclosure should be within the protection scope of the present disclosure. Therefore, the protection scope of the present disclosure shall be subject to the protection scope of the claims.
    权利要求:
    Claims (16)
    [0001] An array substrate, comprising:
    a base substrate; and
    a plurality of pixel units arranged in an array on a base substrate, each pixel unit including an open-circuit repair structure, an OLED, and a pixel driving circuit, wherein,
    the open-circuit repair structure includes a repair line;
    an orthographic projection of the repair line on the base substrate partially or completely overlaps with an orthographic projection of an anode of the OLED on the base substrate to form an overlapping region; and
    an open-circuit repair point is located in the overlapping region.
    [0002] The array substrate according to claim 1, wherein the pixel driving circuit includes at least one thin film transistor; the at least one thin film transistor is a driving thin film transistor, or the at least one thin film transistor is a driving thin film transistor and a switching thin film transistor.
    [0003] The array substrate according to claim 2, wherein a repair line in any one of two adjacent pixel units is coupled to a drain of a driving thin film transistor in another pixel unit of the two adjacent pixel units.
    [0004] The array substrate according to claim 1, wherein an insulating film layer is disposed between the repair line and the anode of the OLED.
    [0005] The array substrate according to claim 3, wherein in a case where the two adjacent pixel units are pixel units in adjacent rows and a same column, the repair line in any one of the two adjacent pixel units is an extension line of the drain of the driving thin film transistor in another pixel unit of the two adjacent pixel units.
    [0006] The array substrate according to claim 5, wherein an orthographic projection of an extension line of the anode of an OLED in any one of the two adjacent pixel units on the base substrate partially or completely overlaps with an orthographic projection of the extension line of the drain of the driving thin film transistor in another pixel unit of the two adjacent pixel units on the base substrate to form an overlapping region.
    [0007] The array substrate according to claim 6, wherein a passivation layer and a planarization layer are stacked on a surface of an extension line of the drain of a driving thin film transistor of each pixel unit proximate to the extension line of the anode of an OLED in the pixel unit; anda region of the planarization layer corresponding to the open-circuit repair point is provided with a groove, and the groove is covered with the extension line of the anode.
    [0008] The array substrate according to claim 7, wherein via holes are formed in the passivation layer and the planarization layer, and the drain of the driving thin film transistor is coupled to the anode of the OLED through one of the via holes.
    [0009] The array substrate according to claim 3, wherein in a case where the two adjacent pixel units are pixel units in adjacent columns and a same row, the repair line in any one of the two adjacent pixel units is insulated from a gate of the driving thin film transistor in another pixel unit of the two adjacent pixel units in a same layer, and an interlayer insulating layer is disposed between the repair line and the drain of the driving thin film transistor.
    [0010] The array substrate according to claim 9, wherein the interlayer insulating layer is provided with via holes, and the drain of the driving thin film transistor is coupled to the repair line through one of the via holes.
    [0011] The array substrate according to claim 9, whereinan interlayer insulating layer, a passivation layer and a planarization layer are stacked between the repair line in each pixel unit and the anode of the OLED in the pixel unit;a region of the planarization layer corresponding to the open-circuit repair point is provided with a groove, and the groove is covered with the anode of the OLED in the pixel unit; orregions of the planarization layer and the passivation layer corresponding to the open-circuit repair point are provided with grooves, and the grooves are covered with the anode of the OLED in the pixel unit.
    [0012] The array substrate according to claim 2, wherein a gate of the switching thin film transistor is coupled to a gate line, and a source of the switching thin film transistor is coupled to a data line.
    [0013] The array substrate according to claim 1, wherein pixel units in a same row correspond to a same gate line; andan orthographic projection of the repair line in each pixel unit on the base substrate intersects with an orthographic projection of a corresponding gate line on the base substrate.
    [0014] The array substrate according to claim 1, wherein pixel units in a same column correspond to a same data line; andan orthographic projection of the repair line on the base substrate intersects with an orthographic projection of a corresponding data line on the base substrate.
    [0015] The array substrate according to claim 1, wherein portions of the plurality of pixel units corresponding to open-circuit repair points of anodes of OLEDs are covered with a pixel defining layer.
    [0016] A display device, comprising the array substrate according to any one of claims 1-15, wherein the array substrate includes:
    a base substrate; and
    a plurality of pixel units arranged in an array on the base substrate, each pixel unit including an open-circuit repair structure, an OLED, and a pixel driving circuit, wherein,
    the open-circuit repair structure includes a repair line; an orthographic projection of the repair line on the base substrate partially or completely overlaps with an orthographic projection of the anode of the OLED on the base substrate to form an overlapping region; and
    an open-circuit repair point is disposed in the overlapping region.
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    同族专利:
    公开号 | 公开日
    US20200013992A1|2020-01-09|
    WO2019042474A1|2019-03-07|
    CN207134356U|2018-03-23|
    EP3680935A4|2021-05-05|
    KR20190129998A|2019-11-20|
    US10991917B2|2021-04-27|
    JP2020532754A|2020-11-12|
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